The EM section has a Scanning Electron Microscope (SEM) fitted with an Energy Dispersive Spectrometer (EDS) for elemental analysis. High resolution Secondary Electron Imaging, Backscattered Electron Imaging, X-Ray microanalysis and X-Ray mapping are all possible. In addition, the SEM is equipped with a cryogenic stage allowing for the preservation of fluid phases in the samples, and analysis in situ if necessary.